- Multi-site wafer sorting
- Support up to 12" wafer
- Ambient/cold(-55C)/hot testing
- Heat dissipative chuck
- Pad and bumped wafer probing
- Direct dock probing
- Inkless wafer map and map conversion
- Inline OCR and probe mark inspection
- Available probers
- TEL P8, P12, PRECIO
- TSK UF300, UF200AL